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Shenzhen Yifuda Instrument Co., Ltd.

The main products are: mobile phone comprehensive tester, network analyzer, s...

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home > sell > Shenzhen supplies IQ2010/2011 technology support Yifuda Instruments
Shenzhen supplies IQ2010/2011 technology support Yifuda Instruments
products: Views:6Shenzhen supplies IQ2010/2011 technology support Yifuda Instruments 
brand: LitePoint/莱特波特
price: 1.00元/台
MOQ: 1 台
Total supply: 100 台
Delivery date: Shipped within 3 days from the date of payment by the buyer
Valid until: Long-term validity
Last updated: 2016-11-03 11:55
 
Details
Song Dynasty Contact Person Wu Weishang
Song Dynasty Contact Information
Song Dynasty Welcome to inquire, thank you
Product Name Test System
Product Specifications/
Model
Product Category Wireless Communication Tester
Introduction to the instrument
It is specially designed to reduce the testing cost of multiple communication products. It is an innovative test equipment compatible with multiple wireless standards. It can test the performance of multiple wireless communications at the same time, and Compared with the method of testing individual items one by one, it can save up to % time. In particular, sequence-based testing can shorten the test time by %. Therefore, the test system can save you a lot of testing time and costs.
Details
The test system supports various communication standards such as ./, ./and) and can be used in all stages of wireless communication product development and production.
The test system uses multiple hardware modules to provide multi-task testing functions, allowing two wireless standard groups to be tested in parallel with the Bluetooth and near field communication standard groups. Multiple vector signal generators can provide transmission signals for , Bluetooth and other transmission test operations. Multiple vector signal analyzers provide comparison functions for system reception testing.
The test system contains software function libraries that specifically support various communication standards (./, ./, ./ and). Users can use the built-in graphical user interface or ++ software application interface to select various signal generation and analysis routines. The captured data will be transmitted to the host computer for processing. ++ supports all functions, which makes it easy to build automated test programs for manufacturing or design characterization testing.
Technical Parameters
Parameters/Features
A single instrument can test a variety of wireless standards
and
can test multiple communications in parallel, saving test costs
Can be based on Sequence testing, saving testing costs
Software upgradeable
Multi-functional port, flexible installation and testing
Unified interface/++ Universal for all wireless standards
(See the attachment for specific technical parameters Technical Manual)
Main Features
Designed for testing multiple communication devices
Save testing time through parallel and sequence-based testing methods
Single instrument replaces four or more instruments
Multi-functional ports increase connection flexibility
Unified interface, easy to learn and use
Applicable industries
A large number of wireless product production tests
A large number of multiple communication product tests
Module Test
Terminal Finished Product Test
The system includes RF component connection ports. Two of them support AND respectively, and the other two are public ports (AND), used to connect the tested, and Bluetooth subsystems.
The test system meets all RF calibration, verification and testing needs for connected wireless functions. The system only needs to be plugged in once and can test multiple wireless functions using a single connection. Diversity of RF communication ports provides line flexibility. Users can test a single communication modulation or test the modulation functions of multiple wireless devices at the same time. It can also be used in conjunction with a mobile phone test system to support a complete smartphone test program on one test machine.
Using the multi-task test mode, while testing the Bluetooth communication function sequentially, it can also perform the sequential test mode in parallel. This feature can reduce overall test time by up to %.
Using the sequential test mode for testing, users can shorten the time spent transmitting multiple data rate/power measurements and receiving packet error rates. In the first case, the system cooperates with the device under test to send signals at different data transmission rates. Coupled with the component driver and test program support capabilities, the system can capture multiple burst data rates at once and reduce the communication time between itself and the device under test, thereby shortening the transmission test and calibration time.
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